Holder temperature detection method, holder monitoring method and substrate processing apparatus

A holder monitoring method which monitors a holder that holds a substrate, the method comprising:

• placing the substrate on the holder and introducing a heat exchange gas between the holder and the substrate;
• detecting a temperature of the holder and calculating an integral value of a temperature change of the holder up to a predetermined time;
• and
• evaluating a thermal conductivity between the holder and the substrate based on the integral value,
• wherein the step of detecting a temperature of the holder comprises:
• irradiating a fluorescent body thermally mounted on the holder with a light pulse having a first wavelength;
• detecting fluorescence having a second wavelength emitted from the fluorescent body due to the light pulse;
• and
• estimating the temperature of the holder based on the detected fluorescence,
• wherein an optical waveguide of which one end is disposed to be spaced apart from the fluorescent body and another end is connected to a light source that radiates the light pulse having the first wavelength and a detector that detects the fluorescence having the second wavelength is provided,
• the fluorescent body includes a first fluorescent body thermally mounted on a first surface of the holder opposite to a mounting surface that holds the substrate, and a second fluorescent body thermally mounted on a second surface of the holder opposite to the mounting surface, the second surface being an inner surface of a recessed portion formed in the rotatable holder such that the second fluorescent body is disposed within the recessed portion, the second surface being closer to the mounting surface than the first surface, and
• a position adjusting part which moves the one end of the optical waveguide so that a distance from the one end of the optical waveguide to the second fluorescent body becomes a distance from the one end of the optical waveguide to the first fluorescent body is provided.

A substrate processing apparatus comprising:

• a rotatable holder configured to hold a substrate;
• a fluorescent body thermally mounted on the rotatable holder;
• a light source configured to irradiate the fluorescent body with a light pulse having a first wavelength;
• a detector configured to detect fluorescence having a second wavelength emitted from the fluorescent body due to the light pulse;
• a temperature detection part configured to estimate a temperature of the rotatable holder based on the detected fluorescence;
• and
• an optical waveguide of which one end is disposed to be spaced apart from the fluorescent body and another end is connected to the light source and the detector,
• wherein the fluorescent body includes a first fluorescent body thermally mounted on a first surface of the rotatable holder opposite to a mounting surface that holds the substrate, and a second fluorescent body thermally mounted on a second surface of the rotatable holder opposite to the mounting surface, the second surface being an inner surface of a recessed portion formed in the rotatable holder such that the second fluorescent body is disposed within the recessed portion, the second surface being closer to the mounting surface than the first surface, and
• the substrate processing apparatus further comprises a position adjusting part which moves the one end of the optical waveguide so that a distance from the one end of the optical waveguide to the second fluorescent body becomes a distance from the one end of the optical waveguide to the first fluorescent body.