Adaptive component overhaul using structured light scan data
AssigneePratt & Whitney Canada Corp.
InventorsKevin M. Tracy, Charles Trent Daulton
Life of this patent
Estimating the term…
Abstract
A method of overhaul is provided. During this overhaul method, a substrate is scanned using structured light to provide substrate scan data. The substrate is from a component previously installed within an engine. The substrate scan data is compared to substrate reference data to provide additive manufacturing data. Material is deposited with the substrate using an additive manufacturing device based on the substrate scan data to provide a first object. The first object is scanned using the structured light to provide first object scan data. The first object scan data is compared to first object reference data to provide machining data. The first object is machined using the machining data.
Claims20
A method of overhaul, comprising:
- scanning a substrate using structured light to provide substrate scan data, the substrate from a component previously installed within an engine;
- comparing the substrate scan data to substrate reference data to provide additive manufacturing data;
- depositing material with the substrate using an additive manufacturing device based on the substrate scan data to provide a first object;
- scanning the first object using the structured light to provide first object scan data;
- comparing the first object scan data to first object reference data to provide machining data and providing a non-repaired diameter of the first object as a datum circle, a non-repaired face of the first object as a datum plane and a geometric feature of the first object as a final datum for rotational alignment;
- and
- machining the first object using the machining data;
- wherein the depositing of the material forms a cladding over an upper surface of the substrate to reinforce a wear region of the component.
A method, comprising:
- scanning a substrate using structured light to provide substrate scan data;
- comparing the substrate scan data to substrate reference data to provide additive manufacturing data;
- depositing material with the substrate using an additive manufacturing device based on the additive manufacturing data to provide a first object;
- scanning the first object using structured light to provide first object scan data;
- comparing the first object scan data to the substrate scan data to provide machining data, and providing a non-repaired diameter of the substrate as a datum circle, a non-repaired face of the substrate as a datum plane and a geometric feature of the substrate as a final datum for rotational alignment;
- and
- machining the first object using the machining data;
- wherein the structured light is configured to project a pattern of white light onto the substrate, and the pattern of white light having a wavelength between 400-700 nm.
Dependencies are inferred from the claim text.