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US 12,551,930 B2Granted
Method and device for sorting silicon fragments
OwnerFranz Bergmann, Thomas Schröckinventors
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Abstract
Methods and devices for sorting silicon fragments. The method includes the steps of singulating the chunks in a singulating region and recording the projected area of a chunk in a 2D profile plane with at least one first measuring device. Recording at least one height information item above and/or below the 2D profile plane with at least one further measuring device. Calculating the size of the chunk from the projected area and the height information item and controlling at least one deflecting device as a function of the calculated size.
Claims11
Method for sorting chunks, comprising the steps of:
- singulating the chunks in a singulating region;
- recording the projected area of a chunk in a 2D profile plane with at least one first measuring device;
- recording at least one height information item above and/or below the 2D profile plane with at least one further measuring device;
- calculating the size of the chunk from the projected area and the height information item;
- and
- controlling at least one deflecting device as a function of the calculated size;
- wherein the first measuring device is a photoelectric transmitted-light or reflected-light measuring system having a detection region through which the chunk passes in freefall and the further measuring device is a light curtain or a light grid;
- and
- wherein the recording of the projected area and the recording of the height information item take place with a time spacing of from 0 to 100 ms.
6 more elements
Device for sorting chunks, comprising:
- a singulating region for singulating the chunks;
- at least one first measuring device for recording the projected area of a chunk in a 2D profile plane;
- at least one further measuring device for recording a height information item above and/or below the 2D profile plane;
- at least one deflecting device;
- and a software-aided controller which calculates a size of the chunk from the projected area and the height information item and controls the deflecting device as a function of this size;
- and
- wherein the first measuring device is a photoelectric transmitted-light or reflected-light measuring system having a detection region through which the chunk passes in freefall and the further measuring device is a light curtain or a light grid.
4 more elements
Dependencies are inferred from the claim text.