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US 12,549,234 B2Granted
Measurement parameter determination method, terminal device, chip, and storage medium
AssigneeGuangdong Oppo Mobile Telecommunications Corp., Ltd.
InventorRongyi Hu
Life of this patent
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Abstract
The present application relates to a measurement parameter determination method, a terminal device, a chip, and a storage medium, the method comprising: on the basis of the processing time of a plurality of measurement objects, determining measurement parameters of a target measurement object amongst the plurality of measurement objects, the measurement parameters being used for determining the measurement cycle of the target measurement object.
Claims12
A measurement parameter determining method, comprising:
- determining a measurement parameter of a target measurement object among a plurality of measurement objects according to processing times of the plurality of measurement objects, wherein the measurement parameter is used to determine a measurement cycle of the target measurement object,
- wherein the plurality of measurement objects comprises a first measurement object and a second measurement object, and the target measurement object comprises at least one of the first measurement object and the second measurement object, the first measurement object comprises a first signal to be measured, and the second measurement object comprises a second signal to be measured;
- and
- the determining the measurement parameter of the target measurement object among the plurality of measurement objects according to the processing times of the plurality of measurement objects, comprises:
- determining the measurement parameter of the target measurement object in a case that the first signal to be measured is within the processing time of the second signal to be measured,
- wherein a target signal to be measured in the target measurement object is located in a j-th measurement gap MG within a preset time domain range;
- wherein the target signal to be measured is the first signal to be measured or the second signal to be measured, and j is a positive integer,
- wherein the method further comprises:
- determining a measurement parameter of a third measurement object;
- wherein, the third measurement object comprises a third signal to be measured located in the j-th MG,
- wherein the determining the measurement parameter of the third measurement object comprises:
- determining a number of competing objects of the third measurement object in the j-th MG according to a number of signals to be measured other than the target signal to be measured in the j-th MG.
9 more elements
A terminal device, comprising:
- a processor and a memory, the memory is configured to store a computer program, and the processor is configured to invoke and run the computer program stored in the memory, to:
- determine a measurement parameter of a target measurement object among a plurality of measurement objects according to processing times of the plurality of measurement objects, wherein the measurement parameter is used to determine a measurement cycle of the target measurement object,
- wherein the plurality of measurement objects comprises a first measurement object and a second measurement object, and the target measurement object comprises at least one of the first measurement object and the second measurement object, the first measurement object comprises a first signal to be measured, and the second measurement object comprises a second signal to be measured;
- and
- the processor is configured to determine the measurement parameter of the target measurement object in a case that the first signal to be measured is within the processing time of the second signal to be measured,
- wherein a target signal to be measured in the target measurement object is located in a j-th measurement gap MG within a preset time domain range;
- wherein the target signal to be measured is the first signal to be measured or the second signal to be measured, and j is a positive integer,
- wherein the processor is configured to:
- determine a measurement parameter of a third measurement object;
- wherein, the third measurement object comprises a third signal to be measured located in the j-th MG,
- wherein the processor is configured to:
- determine a number of competing objects of the third measurement object in the j-th MG according to a number of signals to be measured other than the target signal to be measured in the j-th MG.
9 more elements
Dependencies are inferred from the claim text.