Run-time modification of data monitoring platform metrics
AssigneeOracle International Corporation
InventorsVivian Qian Lee, Hugo Alexandre Pereira Monteiro
Life of this patent
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AssigneeOracle International Corporation
InventorsVivian Qian Lee, Hugo Alexandre Pereira Monteiro
Estimating the term…
Techniques for creating a custom metric type to be added to a set of metrics generated by a data monitoring platform at run-time are disclosed. A system receives values defining properties of a custom metric type based on a custom metric template and a custom schema template. The system generates an instruction set, based on the values associated with the custom metric template, for generating the custom metric type on an executing data monitoring system. The system validates the instruction set and the custom schema to verify that the definitions for the custom metric type and the custom schema may be executed by the data monitoring system. The system adds the custom metric type, at run-time, to a set of metrics generated by the data monitoring system.
A non-transitory computer readable medium comprising instructions which, when executed by one or more hardware processors cause performance of operations comprising:
A method, comprising:
A system comprising:
Dependencies are inferred from the claim text.