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US 12,546,812 B2Granted
Test device capable of testing micro LED and manufacturing method thereof
AssigneePoint Engineering Co., Ltd.
InventorsBum Mo Ahn, Seung Ho Park, Young Heum Eom
Life of this patent
Estimating the term…
Abstract
Proposed are a test device and a manufacturing method of the test device capable of testing a test object that is provided with an electrode which has a size and/or a pitch distance ranging from 1 to 100 micrometers (μm).
Claims10
A test device comprising:
- an insulation member having a flat plate shape;
- and
- a conductive part integrally provided with a wiring part that is provided inside the insulation member and with a connection part which is provided outside the insulation member and which is configured to be connected to a test object,
- wherein the insulation member is an anodic oxide film in which a base metal is anodized and then the base metal is removed.
1 more element
A test device comprising:
- at least one insulation member having a flat plate shape in which an area of an x-y plane is larger than a thickness in a z direction;
- and
- at least one conductive part having a thickness equal to or less than the thickness of the insulation member, the conductive part having a first portion mounted inside the insulation member and having a second portion that is positioned by extending outward to the insulation member,
- wherein the at least one insulation member is a plurality of insulation members, and the at least one conductive part is a plurality of conductive part;
- wherein the test device is configured such that the plurality of insulation member is bonded to each other by a bonding part;
- and
- wherein a thickness in the z direction of the bonding part affects a pitch distance between a plurality of conductive parts.
4 more elements
A test device comprising:
- at least one insulation member having a flat plate shape that has a first surface of an x-y plane and a second surface of the x-y plane facing the first surface;
- and
- at least one conductive part having at least a portion provided between the first surface and the second surface such that the portion is positioned on a penetration part that extends inward from any one side portion of the insulation member, the conductive part having a remaining portion positioned by extending outward to the insulation member and being configured to be connected to a test object,
- wherein the at least one insulation member is a plurality of insulation members, and the at least one conductive part is a plurality of conductive part;
- wherein the test device is configured such that the plurality of insulation members is bonded to each other by a bonding part;
- and
- wherein a thickness in a z direction of the bonding part affects a pitch distance between the plurality of conductive parts.
4 more elements
Dependencies are inferred from the claim text.