Linearization of delay domain analog-to-digital converters
AssigneeTexas Instruments Incorporated
InventorsMishab I, Viswanathan Nagarajan, Himanshu Varshney, Mujammil Patel, Karan Vaity
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AssigneeTexas Instruments Incorporated
InventorsMishab I, Viswanathan Nagarajan, Himanshu Varshney, Mujammil Patel, Karan Vaity
Estimating the term…
A delay-domain analog-to-digital converter (ADC) including first and second ADCs and corresponding look-up table (LUT) memories. Control logic controls the first ADC to convert a first analog level plus a first offset to a first digital value; controls the second ADC to convert the first analog level plus a second offset to a second digital value; and computes a first difference value between the first and second digital values. The control logic further controls the first ADC to convert the first analog level minus the first offset to a third digital value; controls the second ADC to convert the first analog level plus the second offset to a fourth digital value; computes a second difference value between the third and fourth digital values; and adjusts a correction value for the first analog level in the LUT memory based on a third difference between the first and second difference values.
A method, comprising:
A circuit, comprising:
An analog-to-digital converter, comprising:
Dependencies are inferred from the claim text.