Machine function analysis with radar plot
AssigneeSofting AG
InventorsKeith A. Walton, Kai T. Bouse
Life of this patent
Estimating the term…
Abstract
A system and method for detecting abnormal operating conditions in a machine through the analysis and comparison of radar areas after the transformation of waveform data collected from machine parts. The system and method may detect abnormal operating conditions at times when the machine under evaluation remains fully operational in its intended working environment. The system and method may identify abnormal machine function at a point in the machine wear cycle when an abnormal function is not apparent to a human observer.
Claims20
A method for identifying abnormal operation of a machine, the method comprising:
- generating a monitoring signal while the machine is in operation;
- collecting waveform data from the monitoring signal;
- establishing an operational baseline of the machine;
- processing the waveform data into a radar plot;
- determining an area of the radar plot;
- and
- correlating changes in the area with changes in operation of the machine.
A method for identifying an abnormal structural condition of a structure, the method comprising:
- generating a monitoring signal;
- collecting waveform data from the monitoring signal;
- establishing an operational baseline of the structure processing the waveform data into a radar plot;
- determining an area of the radar plot;
- and
- correlating changes in the area with the abnormal structural condition of the structure.
A system for identifying abnormal behavior of a machine, the system comprising:
- a sensing device that monitors at least one operating behavior of the machine, wherein the sensing device generates waveform data;
- a memory for storing the waveform data, an electronic data processor that in communication with the memory and the sensing device, the data processor being configured cooperate with the sensing device and the memory to:
- analyze the waveform data;
- define a baseline condition of the waveform data;
- determine a radar area from the waveform data;
- monitor changes in the waveform data;
- and
- determine when the radar area changes from the baseline condition by a threshold amount.
Dependencies are inferred from the claim text.