Calculation method and calculation device
AssigneeSumitomo Electric Industries, Ltd.
InventorTakeshi Kawasaki
Life of this patent
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AssigneeSumitomo Electric Industries, Ltd.
InventorTakeshi Kawasaki
Estimating the term…
A calculation method includes acquiring N matrices corresponding to N sets, each of N matrices being a matrix of a circuit network including first and second terminals, each of N sets being a set of first voltage applied to first terminal and second voltage applied to second terminal, and extracting values of L parameters based on N matrices using a first model of an intrinsic circuit and a second model of a distributed constant circuit. First model is represented by a function of at least one of first voltage and second voltage, each of L/2 impedance elements includes first end connected to one of first to sixth terminals, and second end connected to terminal other than the one of first to sixth terminals, and second model is represented by values of L parameters including two real number parameters related to impedance of each of L/2 impedance elements.
A method for improving the accuracy of circuit simulation for a high-frequency element by generating, from measured S-parameter data, a frequency-dependent distributed-constant model that captures parasitic effects unaccounted for by conventional lumped models, the high-frequency element comprising a first terminal configured to receive a high-frequency input signal, a second terminal configured to output the high-frequency signal, and a third terminal configured to receive a reference potential, the method comprising:
A computer-implemented method for improving the accuracy of circuit simulation for a high-frequency element by calculating, from measured S-parameter data, a frequency-dependent scattering-parameter matrix using a six-terminal distributed-constant model that captures parasitic effects unaccounted for by conventional lumped models, the method comprising:
A calculation device for improving the accuracy of circuit simulation for a high-frequency element by generating, from measured S-parameter data, a frequency-dependent distributed-constant model that captures parasitic effects unaccounted for by conventional lumped models, the high-frequency element comprising a first terminal configured to receive a high-frequency input signal, a second terminal configured to output the high-frequency signal, and a third terminal configured to receive a reference potential, the calculation device comprising:
A calculation device for improving the accuracy of circuit simulation for a high-frequency element by calculating, from measured S-parameter data, a frequency-dependent scattering-parameter matrix using a six-terminal distributed-constant model that captures parasitic effects unaccounted for by conventional lumped models, the high-frequency element comprising a first terminal configured to receive a high-frequency input signal, a second terminal configured to output the high-frequency signal, and a third terminal configured to receive a reference potential, the calculation device comprising:
Dependencies are inferred from the claim text.