System for testing device under test using remote data center
AssigneeKeysight Technologies, Inc.
InventorsJared Richard, Chris R. Jacobsen, Gregory S. Hill
Life of this patent
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AssigneeKeysight Technologies, Inc.
InventorsJared Richard, Chris R. Jacobsen, Gregory S. Hill
Estimating the term…
A system is proved for performing testing of devices under test (DUTs). The system includes edge sensors configured to collect measurement data from and to provide stimulus data to the DUTs for performing testing of the DUTs, where each edge sensor includes a data transducer and an intelligent network interface card configured to manage a transfer of the measurement data via a high-speed data network using remote direct memory access (RDMA); and a remote data center remote from the edge sensors, where the remote data center is scalable with respect to the number of edge sensors, and is configured to communicate with the edge sensors over the high-speed data network, where communicating with the edge sensors includes at least sending control signals for controlling the testing, receiving the measurement data, and/or sending the stimulus data.
A system for performing testing of a plurality of devices under test (DUTs) remotely, the system comprising:
A system for performing testing of a device under test (DUT), the system comprising:
A method for performing testing of a at least one device under test (DUT) using remote data processing, the method comprising:
Dependencies are inferred from the claim text.