Phased array ultrasonic testing device

A phased array ultrasonic testing device for positioning first and second phased array probes to test a material, the testing device comprising:

• a first wedge comprising a bottom side, a top side, inner and outer lateral sides, and a mounting position configured to receive the first phased array probe with the top side positioned at a first acute angle relative to the bottom side;
• a second wedge comprising a bottom side, a top side, inner and outer lateral sides, and a mounting position configured to receive the second phased array probe with the top side positioned at a second acute angle relative to the bottom side;
• a coupling structure that aligns the first and second wedges together with the inner lateral sides positioned together, the bottom sides aligned in a plane, and the top sides angled outward away from each other, the coupling structure configured to provide for relative parallel movement between the first and second wedges with the bottom sides remaining aligned within the plane and the top sides at a fixed angular position relative to each other;
• and
• a scale attached to the first wedge and the second wedge to measure a distance between the mounting positions of the first and second wedges, the scale positioned away from the top sides of the first and second wedges to be accessible on one of the lateral sides of the first and second wedges.

A method of non-destructive testing a material using first and second phased array probes, the method comprising:

• supporting the first and second phased array probes in a testing device having first and second wedges configured to respectively maintain the first and second phased array probes in corresponding orientations relative to a surface of the material upon which the testing device is placed;
• coupling together the first and second wedges to selectively allow relative movement thereof in first and second directions in a first plane while restricting relative movement in other directions outside of the first plane;
• moving the first and second wedges relative to each other in the first and second directions and adjusting a distance between the first and second phased array probes;
• measuring the distance between the first and second phased array probes while moving the first and second wedges;
• locking the first and second wedges together at a selected distance and preventing relative movement between the first and second wedges;
• and
• moving the testing device along the surface with the first and second wedges locked together.