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US 12,530,995 B2Granted
Method of testing a microdevice in integrated systems
AssigneeVueReal Inc.
InventorGholamreza Chaji
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Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Claims13
A method of testing microdevices on a substrate, the method comprising:
- depositing a conductive material directly onto the substrate to form a temporary external electrode;
- after the conductive material has been deposited on the substrate to form the temporary external electrode, providing the microdevices in a partially or fully populated system on the temporary external electrode;
- providing a capacitive coupling between the temporary external electrode and a floating contact of the microdevices to stimulate the microdevices;
- extracting different device parameters from a response generated by the capacitive coupling;
- and
- removing the temporary external electrode from the microdevices.
3 more elements
Dependencies are inferred from the claim text.