Method for measuring actual area of defect, and method and apparatus for testing display panel
AssigneeBoe Technology Group Co., Ltd.
InventorsWangqiang He, Yiwen Ding, Yuanyuan Lu, Dong Chai, Hong Wang
Life of this patent
Estimating the term…
Loading patent…
AssigneeBoe Technology Group Co., Ltd.
InventorsWangqiang He, Yiwen Ding, Yuanyuan Lu, Dong Chai, Hong Wang
Estimating the term…
A method and apparatus for measuring the actual area of a defect, and a method and apparatus for testing a display panel. The method for measuring the actual area of a defect includes: acquiring a measurement image of a display panel, wherein the measurement image has a defect region; according to the measurement image, determining the area of defect pixels of the defect in the measurement image and determining the size of reference object pixels of a reference object in the measurement image; and according to the area of the defect pixels, the size of the reference object pixels and the actual size of the reference object, determining the actual area of the defect in the display panel.
A method for inspecting a display panel, comprising:
A device for inspecting a display panel, comprising:
Dependencies are inferred from the claim text.