Optoelectronic measuring device for measuring the intensity of electromagnetic radiation in a frequency-resolved manner

A method for the frequency-resolved measurement of an intensity of electromagnetic radiation, wherein the method comprises:

• collimating the electromagnetic radiation by means of two collimators for each measurement channel;
• and
• measuring the intensity of the electromagnetic radiation by means of a plurality of measurement channels, a first measurement channel of the plurality of measurement channels having a first spectral sensitivity and a further measurement channel of the plurality of measurement channels having a further spectral sensitivity different from the first spectral sensitivity, wherein each measurement channel of the plurality of measurement channels comprises precisely one spectral filter;
• wherein:
• a separate optical path extends through each collimator of the two collimators for each measurement channel to one or more measurement channels of the plurality of measurement channels, and each measurement channel of the plurality of measurement channels measures the intensity of the electromagnetic radiation collimated by means of one or more collimators of the two collimators for each measurement channel;
• wherein each collimator of the two collimators for each measurement channel is configured to collimate the electromagnetic radiation for each measurement channel used for measuring the intensity;
• wherein each collimator of the two collimators for each measurement channel comprises a collimation lens and an aperture diaphragm;
• and
• wherein the separate optical paths extending through the two collimators for each measurement channel both extend through the precisely one spectral filter of each measurement channel.