Semiconductor devices providing test mode related to reliability
AssigneeSK hynix Inc.
InventorYun Suk Hong
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a pull-up source voltage generation circuit configured to drive a pull-up voltage to a normal voltage during a normal period and to drive the pull-source voltage to a test voltage during a test period. The semiconductor device also includes a pull-down source voltage generation circuit configured to drive a pull-down voltage to a ground voltage during the normal period and to drive the pull-down source voltage to a bit line pre-charge voltage during the test period. The semiconductor device further includes an equalization control signal driver configured to receive the pull-up source voltage and the pull-down source voltage to drive an equalization control signal for equalizing voltage levels of an internal bit line pair of a bit line sense amplifier.
Claims12
A semiconductor device comprising:
- a pull-up source voltage generation circuit configured to drive a pull-up voltage to a normal voltage during a normal period, and to drive the pull-up source voltage to a test voltage during a test period;
- a pull-down source voltage generation circuit configured to drive a pull-down voltage to a ground voltage during the normal period, and to drive the pull-down source voltage to a bit line pre-charge voltage during the test period;
- and
- an equalization control signal driver configured to receive the pull-up source voltage and the pull-down source voltage to drive an equalization control signal for equalizing voltage levels of an internal bit line pair of a bit line sense amplifier.
A semiconductor device comprising:
- a pull-up source voltage generation circuit configured to drive a pull-up voltage to a normal voltage during a normal period, and to drive the pull-up source voltage to a test voltage during a test period;
- a pull-down source voltage generation circuit configured to drive a pull-down voltage to a ground voltage during the normal period, and to drive the pull-down source voltage to a bit line pre-charge voltage during the test period;
- and
- a driver configured to receive the pull-up source voltage and the pull-down source voltage to drive a control signal.
Dependencies are inferred from the claim text.