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US 12,523,639 B2Granted
Analysis method
AssigneeKabushiki Kaisha Toshiba
InventorKanako Ogawa
Life of this patent
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Abstract
According to one embodiment, an analysis method includes a first analysis and a second analysis. The first analysis detects a presence or absence of phthalates in a sample by irradiating ultraviolet light on a plate. The sample is developed on the plate by thin-layer chromatography. The second analysis detects a presence or absence of butyl benzyl phthalate in the sample by supplying a color reagent to the plate on which the sample is developed.
Claims9
An analysis method, comprising:
- a first analysis detecting a presence or absence of phthalates in a sample by irradiating ultraviolet light on a plate, the sample being developed on the plate by thin-layer chromatography;
- and
- a second analysis detecting a presence or absence of butyl benzyl phthalate in the sample by supplying a color reagent to the plate on which the sample is developed.
An analysis method, comprising:
- performing an analysis detecting a presence or absence of phthalates in a sample by irradiating ultraviolet light on a first plate, the sample being developed on the first plate by thin-layer chromatography using a first developing solvent, and
- when a component having a same Rf value as phthalates is detected in the analysis, performing an additional analysis detecting a presence or absence of phthalates in the sample by irradiating ultraviolet light on a second plate,
- the sample being developed on the second plate by thin-layer chromatography using a second developing solvent,
- a component of the first developing solvent being different from a component of the second developing solvent.
1 more element
Dependencies are inferred from the claim text.