Methods and apparatus for controlling electron density distributions
AssigneeASML Netherlands B.V.
InventorsPetrus Wilhelmus Smorenburg, Otger Jan Luiten, Brian Herman Schaap, Jim Gerardus Hubertus Franssen
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AssigneeASML Netherlands B.V.
InventorsPetrus Wilhelmus Smorenburg, Otger Jan Luiten, Brian Herman Schaap, Jim Gerardus Hubertus Franssen
Estimating the term…
A method for controlling a density distribution of electrons provided by an electron source for use in hard X-ray, soft X-ray and/or extreme ultraviolet generation, the method comprising generating a plurality of electrons from a pattern of ultracold excited atoms using an ionization laser inside a cavity, wherein the electrons have a density distribution determined by at least one of the patterns of excited atoms and the ionization laser, and accelerating the electrons out of the cavity using a non-static acceleration profile, wherein the acceleration profile controls the density distribution of the electrons as they exit the cavity.
A radiation source for generating an emitted radiation comprising hard X-ray, soft X-ray and/or extreme ultraviolet, comprising:
A method of compressing a density distribution comprising bunches of electrons for coherent hard X-ray, soft X-ray and/or extreme ultraviolet emitted radiation generation, the method comprising:
A method for generating an emitted radiation comprising hard X-ray, soft X-ray and/or extreme ultraviolet, the method comprising:
An Inverse Compton Scattering source for generating an emitted radiation comprising hard X-ray, soft X-ray and/or extreme ultraviolet, comprising an optical modulator configured to modulate momentum of pulses of electrons.
A radiation source for generating an emitted radiation comprising hard X-ray, soft X-ray and/or extreme ultraviolet, comprising:
A metrology apparatus comprising:
Dependencies are inferred from the claim text.