Yield rate by calibrating parameters of a radio frequency power amplifier
AssigneeCypress Semiconductor Corporation
InventorsKuan-Yu Chen, Chun-Min Wang
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Abstract
Implementations disclosed describe techniques and systems for calibrating parameters of a radio frequency power amplifier. The disclosed techniques include, among other things, identifying an initial power amplifier (PA) parameter set of a radio frequency (RF) module. A plurality of candidate PA parameter sets is generated. A set of error values for each of the plurality of candidate PA parameter sets is determined. A subset of the plurality of candidate PA parameter sets is identified. Each error value of the set of error values of each candidate parameter set in the subset satisfies an error threshold. A final PA parameter set is stored.
Claims20
A method comprising:
- identifying an initial power amplifier (PA) parameter set of a radio frequency (RF) module;
- generating, based on the initial PA parameter set, a plurality of candidate PA parameter sets, wherein each of the plurality of candidate parameter sets is unique;
- determining a set of error values for each of the plurality of candidate PA parameter sets, wherein each set of error values comprises an error value between a measured power and a target power for each power level of the RF module;
- identifying a subset of the plurality of candidate PA parameter sets, wherein each error value of the set of error values of each candidate parameter set in the subset satisfies an error threshold;
- and
- storing a final PA parameter set, wherein the final PA parameter set is one of the candidate PA parameter set in the subset.
An radio frequency (RF) module comprising:
- a power amplifier of a radio frequency (RF) module;
- and
- a processing device coupled to the power amplifier, wherein the processing device is to:
- identify an initial power amplifier (PA) parameter set of the power amplifier;
- generate, based on the initial PA parameter set, a plurality of candidate PA parameter sets, wherein each of the plurality of candidate parameter sets is unique;
- determine a set of error values for each of the plurality of candidate PA parameter sets, wherein each set of error values comprises an error value between a measured power and a target power for each power level of the RF module;
- identify a subset of the plurality of candidate PA parameter sets, wherein each error value of the set of error values of each candidate parameter set in the subset satisfies an error threshold;
- and
- store a final PA parameter set, wherein the final PA parameter set is one of the candidate PA parameter set in the subset.
A processing device comprising:
- a memory to store an initial PA parameter set of a power amplifier of a radio frequency (RF) module and a set of instructions;
- and
- a processing core to execute the instructions to perform operations comprising:
- generate, based on the initial PA parameter set, a plurality of candidate PA parameter sets, wherein each of the plurality of candidate parameter sets is unique;
- determine a set of error values for each of the plurality of candidate PA parameter sets, wherein each set of error values comprises an error value between a measured power and a target power for each power level of the RF module;
- identify a subset of the plurality of candidate PA parameter sets, wherein each error value of the set of error values of each candidate parameter set in the subset satisfies an error threshold;
- and
- store, to the memory, a final PA parameter set, wherein the final PA parameter set is one of the candidate PA parameter set in the subset.
Dependencies are inferred from the claim text.