Adaptive scanning of memory devices with supervised learning
AssigneeMicron Technology, Inc.
InventorsLi-Te Chang, Murong Lang, Charles See Yeung Kwong, Vamsi Pavan Rayaprolu, Seungjune Jeon, Zhenming Zhou
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Abstract
A processing device in a memory sub-system determines one or more read margin levels associated with the memory device. A machine learning model is applied to the one or more read margin levels to generate a read margin prediction value associated with the memory device. Based on the margin prediction value, the memory device is assigned to a selected bin of a set of bins. A media scan operation is executed on the memory device in accordance with a scan frequency associated with the selected bin.
Claims20
A system comprising:
- a memory device;
- and
- a processing device, operatively coupled with the memory device, to perform operations comprising:
- determining one or more read margin levels associated with the memory device;
- applying a machine learning model to the one or more read margin levels to generate a read margin prediction value associated with the memory device;
- assigning, based on the read margin prediction value, the memory device to a selected bin of a set of bins;
- and
- executing a media scan operation on the memory device in accordance with a scan frequency associated with the selected bin.
A method comprising:
- determining one or more read margin levels associated with a memory device;
- applying, by a processing device, a machine learning model to the one or more read margin levels to generate a read margin prediction value associated with the memory device;
- assigning, based on the read margin prediction value, the memory device to a selected bin of a set of bins;
- and
- executing a media scan operation on the memory device in accordance with a scan frequency associated with the selected bin.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- determining one or more read margin levels associated with a memory device;
- applying a machine learning model to the one or more read margin levels to generate a read margin prediction value associated with the memory device;
- assigning, based on the read margin prediction value, the memory device to a selected bin of a set of bins;
- and
- executing a media scan operation on the memory device in accordance with a scan frequency associated with the selected bin.
Dependencies are inferred from the claim text.