Microscope for examination of a sample and corresponding method of operating such a microscope
AssigneeLeica Microsystems CMS GmbH
InventorStefan Christ
Life of this patent
Estimating the term…
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AssigneeLeica Microsystems CMS GmbH
InventorStefan Christ
Estimating the term…
A microscope for microscopic examination of a sample includes an illumination optics for illuminating the sample, an imaging optics for imaging the sample, a sample chamber for receiving the sample. The sample chamber has a door providing access into the sample chamber. The microscope further includes a first fan assembly arranged on a first side of the sample chamber for blowing atmosphere into the sample chamber or for draining atmosphere out of the sample chamber, through at least one first opening arranged on the first side in a first side wall of the sample chamber, and at least one second opening arranged on a second side in a second side wall of the sample chamber for allowing atmosphere from inside the sample chamber to exit the sample chamber or for allowing atmosphere from outside the sample chamber to enter the sample chamber.
A microscope for microscopic examination of a sample, the microscope comprising
A method of operating a microscope for microscopic examination of a sample, the microscope comprising
Dependencies are inferred from the claim text.