Noise inflow analysis apparatus and method
AssigneeSamsung SDI Co., Ltd.
InventorsMooil Chung, Seongjin Mun
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung SDI Co., Ltd.
InventorsMooil Chung, Seongjin Mun
Estimating the term…
An electromagnetic noise penetration analysis apparatus for analyzing electromagnetic wave noise penetrating a battery management device may include a plurality of internal electrical components grouped as function blocks based on each collective function. The electromagnetic noise penetration analysis apparatus may include one near-field measurement probe positioned near or adjacent to at least one electrical component of an associated function block, the electrical component being previously identified by associated monitoring data operating abnormally during an electromagnetic wave immunity test at a susceptible frequency, and configured to measure intensity of magnetic field near or at the identified electrical component, while simulated electromagnetic noise of a frequency comparable to the susceptible frequency is applied. An analyzer may be configured to quantify intensity of electromagnetic wave noise received by the electrical component represented by the function block based on the intensity of magnetic field measured by the near-field measurement probe.
An electromagnetic noise penetration analysis apparatus for analyzing electromagnetic wave noise penetrating a battery management device that manages at least one battery module and has a plurality of electrical components represented by a plurality of function blocks, the apparatus comprising:
An apparatus for quantifying electromagnetic noise penetration into a device under test, the apparatus comprising:
A method for analyzing electromagnetic wave noise that penetrates into a device under test for testing electromagnetic wave immunity against electromagnetic wave noise penetration, the method comprising:
Dependencies are inferred from the claim text.