Spectral sensitivity measuring device and spectral sensitivity measuring method
AssigneeSony Semiconductor Solutions Corporation
InventorsRyouji Taniguchi, Soichi Kuwahara, Junichi Miyashita
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AssigneeSony Semiconductor Solutions Corporation
InventorsRyouji Taniguchi, Soichi Kuwahara, Junichi Miyashita
Estimating the term…
Provided is a spectral sensitivity measuring device capable of accurately measuring a spectral sensitivity of an imaging device. The spectral sensitivity measuring device according to the present technology includes: a chart generation system that generates a chart including at least one chart portion having at least one color region at a position opposed to an imaging device; and a processing system that calculates a spectral sensitivity of the imaging device on the basis of a captured image, by the imaging device, of the chart generated at the position opposed to the imaging device. According to the spectral sensitivity measuring device according to the present technology, it is possible to provide a spectral sensitivity measuring device capable of accurately measuring the spectral sensitivity of the imaging device.
A spectral sensitivity measuring device, comprising:
A spectral sensitivity measuring method, comprising:
Dependencies are inferred from the claim text.