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US 12,511,104 B2Granted
Systems and methods for analyzing stability using metal resistance variations
AssigneeUNM Rainforest Innovations
InventorJames Plusquellic
Life of this patent
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Abstract
This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.
Claims19
A method for generating a digital value for a physically unclonable function comprising the steps of:
- reviewing a chip bitstring from an integrated circuit;
- classifying each bit of the chip bitstring as a weak bit or a strong bit;
- constructing a bitstring using the classified bits;
- and
- creating a redundant sequence in accordance with the constructed bitstring to generate the digital value for the physically unclonable function;
- and
- recording in a public storage a position for each weak bit and each strong bit in the redundant sequence.
4 more elements
Dependencies are inferred from the claim text.