Bandgap voltage reference core circuit, bandgap voltage reference source and semiconductor memory

A bandgap voltage reference source, comprising a bandgap voltage reference core circuit that comprises a generating circuit, a first voltage dividing circuit and a second voltage dividing circuit,

• wherein the generating circuit is configured to generate a positive temperature coefficient voltage and a negative temperature coefficient voltage, and obtain a positive temperature coefficient current and a negative temperature coefficient current based on the positive temperature coefficient voltage and the negative temperature coefficient voltage;
• the first voltage dividing circuit is connected to the generating circuit and the second voltage dividing circuit respectively, and is configured to generate an initial current based on the positive temperature coefficient current and the negative temperature coefficient current;
• and
• the second voltage dividing circuit is configured to determine a reference voltage based on the initial current, wherein the first voltage dividing circuit and the second voltage dividing circuit affect a voltage dividing proportion of the reference voltage, and the reference voltage has a first-order zero temperature drift coefficient;
• wherein the generating circuit comprises:
• a voltage limiting circuit, a voltage generating circuit and a current dividing circuit;
• and
• the voltage generating circuit and the current dividing circuit are both connected to the voltage limiting circuit,
• wherein the voltage limiting circuit is configured to provide a first clamping voltage and a second clamping voltage, the first clamping voltage being equal to the second clamping voltage;
• the voltage generating circuit is configured to generate the positive temperature coefficient voltage and the negative temperature coefficient voltage based on the first clamping voltage and the second clamping voltage, and obtain the positive temperature coefficient current based on the positive temperature coefficient voltage;
• and
• the current dividing circuit is configured to obtain the negative temperature coefficient current based on the negative temperature coefficient voltage;
• the current dividing circuit comprises:
• a fourth resistor and a fifth resistor, the fourth resistor is connected to the voltage limiting circuit, the fifth resistor is connected to the voltage limiting circuit;
• the fourth resistor and fifth resistor are used to adjust the range of the reference voltage.