Measurement method
AssigneeRenishaw PLC
InventorsJohn Charles Ould, Rose Crossland
Life of this patent
Estimating the term…
Abstract
A method of determining a form measurement for a curved feature of an artefact. The method includes a positioning apparatus relatively moving the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature, and the positioning apparatus relatively moving the artefact and the measurement device other along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature. The method further includes using the first and second sets of data points to determine a form measurement for the artefact.
Claims20
A method of determining a form measurement for a curved feature of an artefact, the method comprising:
- i) a machine tool relatively moving the artefact and a measurement device along a first predefined curved path in a first direction, to obtain a first set of data points along the surface of the curved feature;
- ii) the machine tool relatively moving the artefact and the measurement device along a second predefined curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature;
- and
- iii) using the first and second sets of data points to determine a form measurement for the artefact,
- wherein relative movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction is effected by motion of at least one linear movement axis of the machine tool, which is reversed during the movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction.
A computer implemented method, comprising:
- taking a first set of data points which were obtained by a measurement device mounted on a machine tool whilst the measurement device and an artefact were moved by the machine tool relative to each other along a first predetermined curved path in a first direction,
- taking a second set of data points which were obtained by the measurement device whilst the measurement device and the artefact were moved by the machine tool relative to each other along a second predefined curved path in a second direction, and
- using the first and second data sets to determine a form measurement for the artefact,
- wherein relative movement along a first predefined curved path in the first direction and the second predefined curved path in the second direction is effected by motion of at least one linear movement axis of the machine tool, which is reversed during the movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction.
A processing device which is configured to take a first set of data points which were obtained by a measurement device mounted on a machine tool whilst the measurement device and an artefact were moved by the machine tool relative to each other along a first predefined curved path in a first direction, and to take a second of data points which were obtained by the measurement device whilst the measurement device and the artefact were moved by the machine tool relative to each other along a second predefined curved path in a second direction, and to use the first and second data sets to determine a form measurement for the artefact,
- wherein relative movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction is effected by motion of at least one linear movement axis of the machine tool, which is reversed during the movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction.
An apparatus comprising
- a machine tool on which a measurement device and artefact are located, wherein the apparatus is configured to
- i) cause the machine tool to relatively move the artefact and a measurement device relative along a first predefined curved path in a first direction, to obtain a first set of data points along the surface of the curved feature,
- ii) cause the machine tool to relatively move the artefact and the measurement device other along a second predefined curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature, and
- iii) use the first and second sets of data points to determine a form measurement for the artefact,
- wherein relative movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction is effected by motion of at least one linear movement axis of the machine tool, which is reversed during the movement along the first predefined curved path in the first direction and the second predefined curved path in the second direction.
Dependencies are inferred from the claim text.