Inspection route generation device and inspection route generation method
AssigneeHitachi Astemo, Ltd.
InventorsKaichiro Nishi, Nobuaki Nakasu, Hiroki Morii
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AssigneeHitachi Astemo, Ltd.
InventorsKaichiro Nishi, Nobuaki Nakasu, Hiroki Morii
Estimating the term…
An inspection route generation device generates an inspection route of an external appearance inspection device which performs external appearance inspection on an inspection target based on an image imaged by an imaging unit, and includes: a storage unit which stores inspection position information indicating a plurality of inspection positions at which the imaging unit images the inspection target, and inspection device configuration information indicating a configuration of the external appearance inspection device; and a route determination unit which calculates a route length between respective inspection positions, and a posture change amount of the imaging unit at a time when the imaging unit moves through the plurality of inspection positions, based on the inspection position information and the inspection device configuration information, and determines the inspection route based on the calculated route length and posture change amount.
An inspection route generation device which generates an inspection route of an external appearance inspection device which performs external appearance inspection on an inspection target based on an image imaged by an imaging device, the inspection route generation device comprising a processor, a memory, and an interface, the processor configured to perform:
An inspection route generation method for generating an inspection route of an external appearance inspection device which performs external appearance inspection on an inspection target based on an image imaged by an imaging device, the inspection route generation method comprising:
Dependencies are inferred from the claim text.