DRAM ECC circuit error detection integrity
AssigneeAdvanced Micro Devices, Inc.
InventorsAaron John Nygren, Eric M. Scott
Life of this patent
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AssigneeAdvanced Micro Devices, Inc.
InventorsAaron John Nygren, Eric M. Scott
Estimating the term…
Implementations herein describe a system including a system-on-chip including at least a host and a dynamic random-access memory (DRAM) in communication with the SoC, the DRAM including at least an error correction code engine, the system configured to allow the host to write first data to the DRAM, calculate parity bits for the first write data, store the first write data and the parity bits in a DRAM core of the DRAM, allow the host to write second data to the DRAM, store the second write data in the DRAM core without calculating parity bits for the second write data, enable the DRAM to calculate parity bits of the second write data and compare the parity bits of the second write data to the parity bits of the first write data, and calculate a syndrome based on a comparison to correct errors detected in the DRAM core.
A system comprising:
A dynamic random-access memory (DRAM) comprising:
A method comprising:
Dependencies are inferred from the claim text.