X-ray inspection apparatus and sensitivity correction method for x-ray inspection apparatus

An X-ray inspection apparatus comprising:

• a conveying unit configured to convey an article;
• an X-ray source configured to irradiate the article being conveyed by the conveying unit with X-rays;
• a detection unit configured to detect the X-rays by photon counting;
• a threshold value setting unit configured to set a threshold value for discriminating the X-rays detected by the detection unit into two or more energy regions;
• an inspection unit configured to inspect the article on the basis of the X-rays transmitted through the article and detected by the detection unit;
• and
• a sensitivity correction unit configured to perform sensitivity correction of the detection unit on the basis of the X-rays not transmitted through the article, the X-rays being detected by the detection unit, wherein
• the detection unit is configured to discriminate and detect the X-rays into the two or more energy regions by using the threshold value, and
• the sensitivity correction unit is configured to perform the sensitivity correction when the threshold value setting unit changes the threshold value.