Diagnostic instruments having multiple illumination sources and methods thereof

A method of operating a diagnostic instrument, comprising:

• illuminating an imaging location of the diagnostic instrument with first light having a first spectrum for a first illumination period;
• capturing a first image of the imaging location illuminated by the first light;
• illuminating the imaging location of the diagnostic instrument with second light having a second spectrum for a second illumination period, wherein the second illumination period is less than 150 ms, the second spectrum being more destructive to a chemical received in the diagnostic instrument than the first spectrum;
• and
• capturing a second image of the imaging location illuminated by the second light.

A method of operating a diagnostic instrument, comprising:

• illuminating an imaging location of the diagnostic instrument with first light having a first spectrum for a first illumination period;
• capturing a first image of the imaging location illuminated by the first light;
• analyzing the first image;
• determining, based on the analyzing, a second light to illuminate the imaging location, the second light having a second spectrum, the second spectrum being more destructive to a specimen received in the diagnostic instrument than the first spectrum;
• determining, based on the analyzing, a second illumination period that the second light is to illuminate the imaging location, the second illumination period being less than the first illumination period;
• illuminating the imaging location with the second light for the second illumination period;
• and
• capturing a second image of the imaging location illuminated by the second light.

A diagnostic instrument, comprising:

• an imaging location;
• a first illumination source configured to illuminate the imaging location with first light having a first spectrum for a first period;
• a second illumination source configured to illuminate the imaging location with second light having a second spectrum for a second period, wherein the second spectrum is more destructive to a specimen receivable in the diagnostic instrument than the first spectrum and the second period is less than the first period;
• an imaging device configured to capture a first image of the imaging location illuminated by the first light and a second image of the imaging location illuminated by the second light;
• and
• a computer configured to execute instructions to:
• analyze the first image;
• determine the second spectrum in response to analyzing the first image;
• and
• determine the second period in response to analyzing the first image.