Leak test condition design method, leak test condition design device, leak testing method, and leak testing device
AssigneeFukuda Co., Ltd.
InventorsMao Hirata, Akimitsu Tanabe
Life of this patent
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AssigneeFukuda Co., Ltd.
InventorsMao Hirata, Akimitsu Tanabe
Estimating the term…
A leak test condition design method includes obtaining an internal volume of a test piece and a remaining internal volume of a test piece capsule with the test piece loaded for a differential pressure based air leak test; determining a test air pressure to be applied into the test piece capsule when the differential pressure based air leak test is performed; determining bombing conditions of a helium leak test; obtaining a differential pressure value between a test piece and a master to be gained when the differential pressure based air leak test is performed and converting into an equivalent standard leak rate to derive a differential pressure conversion value; obtaining a helium leak rate of the test piece gained and converting into an equivalent standard leak rate to derive a helium leak rate conversion value; and displaying the derived differential pressure conversion value and helium leak rate conversion value.
A leak test condition design method comprising:
A leak test condition design device comprising:
Dependencies are inferred from the claim text.