Flatness testing for cathodes
AssigneeRaytheon Company
InventorsJoaquim A. Bento, Mark J. Beaulieu
Life of this patent
Estimating the term…
Abstract
An apparatus for testing flatness includes a main fixture defining a longitudinal axis along a direction between a base of the main fixture and a testing end of the main fixture. A gimbal is slidingly engaged to the main fixture to slide in a direction along the longitudinal axis. A biasing member is axially between the base and the gimbal. Three rotating arms are mounted to the testing end of the main fixture. The rotating arms and gimbal are configured to affix a test article in the testing end of the main fixture flat with respect to the three rotating arms to establish a datum plane for flatness testing of the test article.
Claims15
An apparatus for testing flatness comprising:
- a main fixture defining a longitudinal axis along a direction between a base of the main fixture and a testing end of the main fixture;
- a gimbal slidingly engaged to the main fixture to slide in a direction along the longitudinal axis;
- a biasing member axially between the base and the gimbal;
- and
- three rotating arms mounted to the testing end of the main fixture, wherein the rotating arms and gimbal are configured to affix a test article in the testing end of the main fixture flat with respect to the three rotating arms to establish a datum plane for flatness testing of the test article.
A method of testing flatness comprising:
- placing a test article on a gimbal that is slidingly engaged to a main fixture;
- rotating three rotating arms into contact with a datum surface of the test article axially opposite from the gimbal across the test article;
- and
- making multiple micrometer measurements of a test surface of the test article relative to the datum surface to determine whether flatness of the test surface is within one or more tolerable specifications or not.
Dependencies are inferred from the claim text.