Methods for manufacturing a semiconductor wafer using a preheat ring in a wafer reactor
AssigneeGlobalWafers Co., Ltd.
InventorsChieh Hu, Chun-Chin Tu
Life of this patent
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Abstract
A method of manufacturing a semiconductor wafer in a reaction apparatus comprising channeling a process gas into a reaction chamber through the process gas inlet and heating the process gas with the preheat ring having an edge bar. The method also includes adjusting at least one of a velocity and a direction of the process gas with the edge bar, and depositing a layer on the semiconductor wafer with the process gas, wherein the edge bar facilitates forming a uniform thickness of the layer on the semiconductor wafer.
Claims19
A method of manufacturing a semiconductor wafer in a reaction apparatus, the reaction apparatus including an upper dome and a lower dome defining a reaction chamber and an upper liner and a lower liner defining a process gas inlet, the reaction apparatus further including a preheat ring positioned within the reaction chamber for heating a process gas prior to contacting the semiconductor wafer, the preheat ring attached to an inner circumference of the lower liner, the preheat ring including an annular disk and an edge bar positioned on the annular disk, the method comprising:
- channeling the process gas into the reaction chamber through the process gas inlet;
- heating the process gas with the preheat ring;
- adjusting at least one of a velocity and a direction of the process gas with the edge bar;
- and
- depositing a layer on the semiconductor wafer with the process gas, wherein the edge bar facilitates forming a uniform thickness of the layer on the semiconductor wafer.
A method of manufacturing a semiconductor wafer in an epitaxial chemical vapor deposition reactor, the reactor including a process gas inlet, a preheat ring positioned to heat an epitaxial process gas prior to deposition on the semiconductor wafer, the preheat ring connected to an inner circumference of a lower liner, the preheat ring including an annular disk and at least one edge bar on the annular disk, the method comprising:
- channeling the epitaxial process gas into the reactor through the process gas inlet;
- heating the epitaxial process gas with the preheat ring;
- adjusting a velocity and a direction of the epitaxial process gas with a circumferential length of the at least one edge bar;
- and
- depositing an epitaxial layer on the semiconductor wafer with the epitaxial process gas, wherein the at least one edge bar facilitates forming a uniform thickness of the epitaxial layer on the semiconductor wafer.
A method of manufacturing a semiconductor wafer in a reaction apparatus, the reaction apparatus including an upper dome and a lower dome defining a reaction chamber and an upper liner and a lower liner defining a process gas inlet, the reaction apparatus further including a preheat ring positioned within the reaction chamber for heating a process gas prior to contacting the semiconductor wafer, the preheat ring attached to an inner circumference of the lower liner, the preheat ring including an annular disk and a first edge bar and a second edge bar positioned on the annular disk, the method comprising:
- channeling the process gas into the reaction chamber through the process gas inlet;
- heating the process gas with the preheat ring;
- and
- using the first and second edge bars to deposit a uniform thickness layer on the semiconductor wafer with the process gas.
Dependencies are inferred from the claim text.