Systems and methods for focus control in X-rays
AssigneeShanghai United Imaging Healthcare Co., Ltd.
InventorsGuoping Zhu, Jinglin Wu, Tieshan Zhang, Siming Chen, Xu Chu
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Abstract
A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.
Claims20
A system, comprising:
- at least one storage device storing executable instructions, and
- at least one processor in communication with the at least one storage device, when executing the executable instructions, causing the system to perform operations including:
- obtaining a reference value of a tube voltage applied to an x-ray radiation source of an x-ray radiation device for generating x-ray radiation rays;
- determining, based on the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the x-ray radiation device;
- and
- causing the focusing device to shape a focus of the x-ray radiation rays according to the determined value of the focusing parameter, wherein the reference value of the tube voltage is determined based on a reference waveform of the tube voltage.
A method implemented on a computing device having at least one processor and at least one storage device, the method comprising:
- obtaining a reference value of a tube voltage applied to an x-ray radiation source of an x-ray radiation device for generating x-ray radiation rays;
- determining, based on the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the x-ray radiation device;
- causing the focusing device to shape a focus of the x-ray radiation rays according to the determined value of the focusing parameter, wherein the reference value of the tube voltage is determined based on a reference waveform of the tube voltage.
A system, comprising:
- at least one storage device storing executable instructions, and
- at least one processor in communication with the at least one storage device, when executing the executable instructions, causing the system to perform operations including:
- obtaining a feedback or a reference waveform of a tube voltage applied to an x-ray radiation source of an x-ray radiation device for generating x-ray radiation rays;
- determining a changing rate of the feedback or the reference waveform of the tube voltage;
- determining whether the feedback or the reference waveform of the tube voltage belongs to a falling edge or a rising edge based on the changing rate;
- determining, based at least in part on a determined result of which the feedback or the reference waveform of the tube voltage belongs to, a specific value of a focusing parameter associated with a focusing device of the x-ray radiation device;
- and
- causing the focusing device to shape a focus of the x-ray radiation rays according to the determined value of the focusing parameter, wherein the focus of the x-ray radiation rays satisfies an operational constraint under the specific value of the focusing parameter.
Dependencies are inferred from the claim text.