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US 12,500,598 B2Granted
Sample and hold circuit
AssigneeSK hynix Inc.
InventorSe Won Lee
Life of this patent
Estimating the term…
Abstract
A sample and hold circuit includes a sampling circuit including a first amplifier configured to amplify an input voltage to generate an amplification voltage, the sampling circuit configured to perform a sampling operation of sampling the amplification voltage. The sample and hold circuit also includes a holding circuit configured to perform a holding operation of setting an output voltage to a voltage level of the input voltage, based on the sampling operation and an amplification operation of a second amplifier.
Claims13
A sample and hold circuit comprising:
- a sampling circuit including a first amplifier configured to amplify an input voltage to generate an amplification voltage, the sampling circuit configured to perform a sampling operation of sampling the amplification voltage;
- and
- a holding circuit configured to perform a holding operation of setting an output voltage to a voltage level of the input voltage, based on the sampling operation and an amplification operation of a second amplifier,
- wherein the sampling circuit further includes a first capacitor, a first switch that is switched so that the input voltage is applied to an end of the first capacitor during the sampling interval, and a second switch that is switched so that a set voltage is applied to the other end of the first capacitor during the sampling interval, a second capacitor generating a voltage difference between both ends of the second capacitor, based on the amplification voltage during the sampling interval, and a third switch that is switched so that a set voltage is applied to the other end of the second capacitor during the sampling interval.
1 more element
A sample and hold circuit comprising:
- a holding circuit including a second amplifier, the holding circuit configured to perform a holding operation of setting an output voltage to a voltage level of an input voltage;
- and
- a sampling circuit configured to perform a sampling operation, the sampling circuit including:
- a first amplifier generating an amplification voltage by amplifying the input voltage;
- a first capacitor generating a voltage difference between both ends of the first capacitor, based on the input voltage and a set voltage during a sampling interval in which the sampling operation is performed;
- and
- a second capacitor generating a voltage difference between both ends of the second capacitor, based on the amplification voltage and the set voltage during the sampling interval,
- wherein the sampling circuit further includes a first switch that is switched so that the input voltage is applied to an end of the first capacitor during the sampling interval, a second switch that is switched so that the set voltage is applied to the other end of the first capacitor during the sampling interval and a third switch that is switched so that the set voltage is applied to the other end of the second capacitor during the sampling interval.
5 more elements
Dependencies are inferred from the claim text.