US 12,500,257 B2Granted

Ionic conductivity measurement device and method for fuel cell

AssigneesHyundai Motor Company, Kia Corporation

InventorsSung Hee Shin, Jee Youn Hwang, Won Jae Choi, Yun Su Lee, Da Hee Kwak, Hyoun Myung Park, Si Won Kim, Ah Hyeon Park, Ji Hoon Jang, Songi Oh

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Abstract

Disclosed are an ionic conductivity measurement device and method for a fuel cell, which enable accurate measurement of ionic conductivity of a membrane electrode assembly for a fuel cell under various conditions. The ionic conductivity measurement device includes a main body frame, a clamp handle mounted to the upper portion of the main body frame, a lift shaft connected to the clamp handle so as to be movable upwards and downwards, a motion jig mounted to the main body frame so as to be movable upwards and downwards and including an upper support frame connected to the lower end of the lift shaft and a specimen support frame connected to the upper support frame, a lower support frame mounted to the lower end portion of the main body frame, an upper probe pin mounted to the upper support frame, and a lower probe pin mounted to the lower support frame.

Claims14

Dependent claims

An ionic conductivity measurement device for a fuel cell, comprising:

a main body frame mounted onto a lower base frame so as to stand upright;
a plurality of clamp handles mounted to an upper end portion of the main body frame;
a lift shaft connected to each of the plurality of clamp handles so as to be movable upwards and downwards;
a motion jig mounted to the main body frame so as to be movable upwards and downwards, the motion jig comprising an upper support frame connected to a lower end portion of the lift shaft and a specimen support frame integrally connected to the upper support frame;
a lower support frame mounted and fixed to a lower end portion of the main body frame;
an upper probe pin mounted to the upper support frame and configured to be brought into contact with an upper surface of a specimen seated on the specimen support frame when the upper support frame is moved in a downward direction;
and
a lower probe pin mounted to the lower support frame and configured to be in contact with a lower surface of the specimen seated on the specimen support frame.

5 more elements

Dependencies are inferred from the claim text.