X-ray focal spot shape evaluation device and x-ray focal spot shape evaluation method
AssigneeHamamatsu Photonics K.K.
InventorHisaya Hotaka
Life of this patent
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Abstract
An X-ray focal spot shape evaluation apparatus is an apparatus for evaluating an X-ray focal spot shape including an X-ray focal spot size on a target of an X-ray source, and includes an imaging unit and an operation unit. The imaging unit acquires a phase contrast image in a range including an edge of an object disposed on a propagation path of X-rays generated on the target of the X-ray source. The operation unit evaluates the X-ray focal spot shape on the target based on at least the phase contrast image, a linear attenuation coefficient of the object, and a refractive index of the object.
Claims14
An X-ray focal spot shape evaluation apparatus for evaluating an X-ray focal spot shape on a target of an X-ray source, the apparatus comprising:
- an imaging unit configured to acquire a phase contrast image in a range including an edge of an object disposed on a propagation path of X-rays generated on the target;
- and
- an operation unit configured to evaluate the X-ray focal spot shape based on at least the phase contrast image, a linear attenuation coefficient of the object, and a refractive index of the object.
An X-ray focal spot shape evaluation method for evaluating an X-ray focal spot shape on a target of an X-ray source, the method comprising:
- performing an imaging of acquiring, by an imaging unit, a phase contrast image in a range including an edge of an object disposed on a propagation path of X-rays generated on the target;
- and
- performing an operation of evaluating the X-ray focal spot shape based on at least the phase contrast image, a linear attenuation coefficient of the object, and a refractive index of the object.
Dependencies are inferred from the claim text.