Sensor system and method to detect overlapping objects
AssigneeDatalogic IP Tech S.R.L.
InventorsPaolo Tosato, Gianluca Sirigu
Life of this patent
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AssigneeDatalogic IP Tech S.R.L.
InventorsPaolo Tosato, Gianluca Sirigu
Estimating the term…
A system including at least one apparatus that measures thicknesses of objects. The apparatus includes a first emitter, a second emitter, a first receiver, and a second receiver. The first emitter and the second receiver are positioned diagonally opposed across a plane, and the second emitter and the first receiver are positioned diagonally opposed across the plane. The first receiver receives a first signal emitted by the first emitter after reflecting off of an object occupying the plane. The second receiver is positioned to receive a second signal emitted by the second emitter after reflecting off of the object. The apparatus includes a circuitry operable to determine the thickness of the object based on reflections of the first signal and the second signal.
An apparatus, comprising:
A method of operation of an apparatus, the method comprising:
Dependencies are inferred from the claim text.