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US 12,497,562 B2Granted
Beta-sialon phosphor particle and light emitting device
AssigneeDenka Company Limited
InventorsTomohiro Nomiyama, Manabu Kobayashi, Masaru Miyazaki, Tatsuya Okuzono
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Abstract
A europium-doped β-sialon phosphor particle. When the element concentration of a Si atom on the surface portion of the particle that is obtained by analyzing a cross section of the phosphor particle by the energy dispersive X-ray analysis method is indicated by Ps [at %], and the element concentration of a Si atom near the center of the particle that is obtained by an analysis by the same method is indicated by Pc [at %], the Pc-Ps value is 3 at % or more.
Claims7
A europium-doped β-sialon phosphor particle,
- wherein, when an element concentration of a Si atom on a surface portion of the phosphor particle that is obtained by analyzing a cross section of the phosphor particle by an energy dispersive X-ray analysis method is indicated by Ps [at %], and an element concentration of a Si atom near a center of the phosphor particle that is obtained by an analysis by the same method is indicated by Pc [at %], a Pc-Ps value is 5 at % or more and 20 at % or less.
Dependencies are inferred from the claim text.