Flying-over beam pattern scanning hologram microscope device using spatial modulation scanner and translation stage

A flying-over beam pattern scanning hologram microscope device comprising:

• a scan beam generation unit which modulates a phase of a first beam split from a light source to convert the first beam to a first spherical wave through a first lens, converts a second beam to a second spherical wave through a second lens, and then allows the first and second spherical waves to interfere with each other to form a scan beam;
• a scanning unit which comprises a spatial modulation scanner for controlling the incident scan beam in a horizontal direction to be transferred to a projection unit, so as to control a scanning position of the scan beam for an object in horizontal and vertical directions, and a translation stage for moving the object in the vertical direction at a rear end of the projection unit;
• the projection unit which comprises multiple lens systems and an objective lens and projects the scan beam transferred from the scanning unit onto an object plane on which the object is placed;
• and
• a light collection unit which detects a beam that has passed through the objective lens again after fluorescing or being reflected from an object,
• wherein the scan beam projected onto the object plane has different patterns according to focal position and conical angle conditions of each of the first and second spherical waves formed on the spatial modulation scanner.