Enhanced material detection by stereo beam profile analysis

A detector for determining at least one material property of at least one object, wherein the detector comprises

• at least one projector configured for illuminating the object with at least one illumination pattern comprising a plurality of illumination features;
• at least one first camera having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object to the first camera, wherein the first camera is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object in response to illumination by the illumination features, wherein the first camera is arranged such that the first reflection image is imaged under a first direction of view to the object;
• at least one second camera having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object to the second camera, wherein the second camera is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object in response to illumination by the illumination feature, wherein the second camera is arranged such that the second reflection image is imaged under a second direction of view to the object, wherein the first direction of view and the second direction of view differ;
• and
• at least one evaluation device configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles based on signals generated by both the matrix of first optical sensors and the matrix of second optical sensors.