Lamination wafers and method of producing bonded wafers using the same
AssigneeGlobalwafers Japan Co., Ltd.
InventorsTatsuhiko Aoki, Manabu Hirasawa
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AssigneeGlobalwafers Japan Co., Ltd.
InventorsTatsuhiko Aoki, Manabu Hirasawa
Estimating the term…
The occurrence of breaking and chipping at the wafer peripheral edge of a bonded wafer obtained by bonding a lamination wafer on a support wafer is suppressed. A lamination wafer to be bonded to a support wafer includes a large-diameter portion made of a silicon wafer whose peripheral edge is chamfered and a small-diameter portion, whose diameter is smaller than that of the large-diameter portion, formed on the large-diameter portion concentrically and integrally with the large-diameter portion, and the small-diameter portion includes a straight body portion whose side surface is perpendicular to the wafer surface, and a neck portion whose side surface is oblique with a predetermined angle to the wafer between the straight body portion and the large-diameter portion, and the small-diameter portion is formed such that the upper face of the straight body portion is to be bonded to the support wafer.
A lamination wafer, which is to be bonded to a support wafer and thinned by grinding, to form a bonded wafer, comprising:
Dependencies are inferred from the claim text.