Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging

An apparatus comprising:

• a first integrated circuit (IC) comprising measurement circuitry and a transimpedance amplifier (TIA);
• and
• a second IC electrically coupled to the first IC and comprising a photodiode, wherein the measurement circuitry is configured to:
• configure a bias direction of the photodiode of the second IC to reverse biased;
• measure a first voltage at an input of the TIA in the first IC when the photodiode is reverse biased;
• change the bias direction of the photodiode of the second IC from reverse biased to forward biased;
• measure a second voltage at the input of the TIA in the first IC when the photodiode is forward biased;
• and
• determine a measure of connectivity between the first IC and the second IC based on the first and second voltages.

An electronics package comprising:

• a photonics integrated circuit (IC) comprising a photodiode;
• and
• an electrical IC disposed on the photonics IC and comprising measurement circuitry and a transimpedance amplifier (TIA), the measurement circuitry being configured to:
• configure a bias direction of the photodiode to reverse biased;
• measure a first voltage at an input of the TIA when the photodiode is reverse biased;
• change the bias direction of the photodiode from reverse biased to forward biased;
• measure a second voltage at the input of the TIA when the photodiode is forward biased;
• and
• determine a measure of connectivity between the photonics IC and the electrical IC based on the first and second voltages.