Defect detection device and defect detection method
AssigneeYamaha Robotics Co., Ltd.
InventorsHiroshi Munakata, Michael Kirkby, Takuya Adachi
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AssigneeYamaha Robotics Co., Ltd.
InventorsHiroshi Munakata, Michael Kirkby, Takuya Adachi
Estimating the term…
A defect detection device (100) that detects defects in a semiconductor device (13) comprises ultrasonic speakers (21) that ultrasonically vibrate the semiconductor device (13), a laser source (30) that irradiates the semiconductor device (13) with collimated laser light (32), a camera (40) that has an imaging element (42) which acquires images by imaging the semiconductor device (13) that has been irradiated with the collimated laser light (32), and a detection unit (55) that detects defects in the semiconductor device (13) on the basis of the images picked up by the camera (40), wherein the detection unit (55) detects defects in the semiconductor device (13) on the basis of the deviation between images acquired by the camera (40) of the semiconductor device (13) when static and when ultrasonically vibrated.
A defect detection device, detecting a defect of an inspection target, the defect detection device comprising:
A defect detection method for detecting a defect of an inspection target, the defect detection method comprising:
A defect detection device, detecting a defect of an inspection target, the defect detection device comprising:
A defect detection device, detecting a defect of an inspection target, the defect detection device comprising:
A defect detection device, detecting a defect of an inspection target, the defect detection device comprising:
A defect detection device, detecting a defect of an inspection target, the defect detection device comprising:
Dependencies are inferred from the claim text.