Temperature measurement device, temperature measurement method, and temperature attenuation measurement method
AssigneesSEMITEC Corporation, National Institute of Technology, Hirosaki University
InventorsShigenao Maruyama, Takahiro Okabe, Yuya Iseki, Takashi Nonaka, Takuma Kogawa, Yasushi Hosokawa, Yutaro Tabata, Tadashi Matsudate, Toshinori Nakajima, Masaya Higashi, Manabu Orito
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