Storage unit access method, storage unit repair method, die, and memory chip
AssigneeHuawei Technologies Co., Ltd.
InventorsGuoming Shen, Rongbin Liu, Qingqing Wu
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AssigneeHuawei Technologies Co., Ltd.
InventorsGuoming Shen, Rongbin Liu, Qingqing Wu
Estimating the term…
A storage unit access method includes receiving an access request that includes an access address, where the access address includes one or more original addresses of at least one storage unit in a storage apparatus; identifying, based on global repair information, whether a failed unit exists in the storage unit to which the access address points, where the global repair information includes original addresses of all failed units and a redundant address of a redundant unit configured to replace each failed unit; when it is identified that a first failed unit exists, replacing an original address that is in the access address and that points to the first failed unit with a redundant address of a first redundant unit corresponding to the first failed unit; and sending an access request obtained after replacing the original address with the redundant address.
A storage unit access method, applied to a repair apparatus, wherein the method comprises:
A storage unit access method, applied to a storage apparatus including at least one storage unit, wherein the method comprises:
A storage unit access method, applied to a storage apparatus including at least one storage unit, wherein the method comprises:
A repair apparatus, comprising an interface, at least one processor, and at least one memory, wherein
A non-transitory storage medium storing information comprising instructions that, when executed by at least one processor, control the at least one processor to perform operations comprising:
Dependencies are inferred from the claim text.