System and method for mapping chemical elements in a sample
AssigneeBar-Ilan University
InventorsSharon Shwartz, Yishay Klein
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AssigneeBar-Ilan University
InventorsSharon Shwartz, Yishay Klein
Estimating the term…
Measurement system and method are presented for determining spatial distribution of chemical elements in a sample. The system comprises a measurement unit and a control system. The measurement unit is adapted to produce primary radiation having spectral characteristic adapted to excite a number M of chemical elements in the sample to induce secondary radiation responses, and generate spectral measured data indicative of intensity of detected responses. The primary radiation interacting with the sample includes a sequence of two or more encoded radiation patterns of the primary radiation, each having its predetermined spatial intensity pattern. The measured spectral data includes a sequence of data pieces, each being modulated by the respective one of the two or more predetermined spatial intensity patterns of the encoded primary radiation and characterized by sparsity in spectral domain with respect to each spectral component of the secondary radiation response.
A measurement system for determining spatial distribution of chemical elements in a sample, the system comprising:
A method for determining spatial distribution of chemical elements in a sample, the method comprising:
A control system for use in determining spatial distribution of chemical elements in a sample, the control system comprising a computer system comprising data input and output interface, a memory utility, and a data processor, and being in data communication with a measurement system providing measured data comprising two or more measured spectral data pieces indicative of two or more detected secondary radiation responses of a sample modulated by respective two or more predetermined spatial intensity patterns of encoded primary radiation of x-ray and/or gamma-ray spectral ranges and characterized by sparsity in spectral domain with respect to each spectral component of the secondary radiation response, the data processor being configured and operable to receive and analyze said measured data and determine spatial distribution of M chemical elements in the sample, the analysis of the measured data comprising:
Dependencies are inferred from the claim text.