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US 12,468,136 B2Granted
Random access projection microscopy
AssigneeHoward Hughes Medical Institute
InventorsKaspar Podgorski, Daniel Flickinger
Life of this patent
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Abstract
A method of imaging a sample providing light from a light source, directing the provided light into an extended focus, scanning the extended focus across a wavefront modulating element that modulates amplitudes of the light along the extended focus, providing the modulated light to the sample, detecting light emitted from the sample in response to excitation by the modulated light, and generating an image of the sample based on the detected fluorescence emission light.
Claims27
A method of imaging a sample, the method comprising:
- providing light from a light source;
- directing the provided light into an extended focus of light;
- scanning the extended focus of light across a wavefront modulating element a plurality of times, wherein the wavefront modulating element includes a pattern that modulates amplitudes of segments of the extended focus of light as the light is scanned;
- providing different patterns on the wavefront modulating element during different times of the plurality of times that the extended focus is scanned across the wavefront modulating element, wherein the different patterns on the wavefront modulating element modulate amplitudes of segments of the extended focus of the light differently as the light is scanned;
- providing the modulated light from the plurality of times the extended focus is scanned to the sample;
- detecting light emitted from the sample in response to excitation by the modulated light;
- and
- generating an image of the sample based on the detected light.
5 more elements
A system for imaging a sample, the system comprising:
- a light source configured for providing a light beam;
- at least one focusing optical element configured for providing an extended focus of the light beam;
- a wavefront modulating element;
- at least one scanning optical element configured for scanning the extended focus across the wavefront modulating element a plurality of times, wherein the wavefront modulating element is configured for providing different patterns at different times of the plurality of times, which modulate amplitudes of segments of the extended focus of the light beam and wherein the different patterns provided by the wavefront modulating element modulate amplitudes of the segments of the extended focus of the light differently as the light is scanned;
- an objective configured for providing the modulated extended focus of light to the sample;
- at least one detector configured for detecting light emitted from the sample in response to excitation by the modulated light;
- and
- at least one processor configured for generating an image of the sample based on the detected light.
5 more elements
A method comprising:
- providing light from a light source;
- directing the provided light into an extended focus of light;
- scanning the extended focus of light across a wavefront modulating element a plurality of times, wherein the wavefront modulating element includes a pattern that modulates amplitudes of segments of the extended focus of light as the light is scanned;
- providing different patterns on the wavefront modulating element during different times of the plurality of times that the extended focus is scanned across the wavefront modulating element, wherein the different patterns on the wavefront modulating element modulate amplitudes of segments of the extended focus of the light differently as the light is scanned;
- and
- providing the modulated light from the plurality of times the extended focus is scanned to a sample.
3 more elements
Dependencies are inferred from the claim text.