Contact probe

Abstract

An embodiment of the present application provides a contact probe, which comprises a tubular structure, an engagement part, a pushing part and an elastic member. The elastic member is received within the tubular structure; the engagement part is arranged within the tubular structure; the pushing part is arranged within the tubular structure and is arranged at the inner wall of the tubular structure opposite to the engagement part; a part of the elastic member is arranged in the tubular structure, and a side surface at a first end of the elastic member is engaged with the engagement part, and the pushing part presses a side surface of the elastic member facing the pushing part, and both the engagement part and the pushing part press the elastic member to make the elastic member in a bent state, and make a part of the elastic member in the tubular structure to abut closely against the inner wall of the tubular structure. In the present embodiment, when using the contact probe, the elastic member can always bend in one direction and contact with a same part of the inner wall of the tubular structure, which can improve the stability of the structures within the contact probe, so as to improve the stability of electrical testing.

Dependencies are inferred from the claim text.