Apparatus and method for determining a material property of a test specimen in a test specimen region near the surface
AssigneeAIM Systems GmbH
InventorStefan Böttger
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AssigneeAIM Systems GmbH
InventorStefan Böttger
Estimating the term…
The invention relates to an apparatus (1; 1a; 1b; 1c) and a method for determining a material property of a test specimen (5; 5a; 5b; 5c) in a test specimen region (6; 6a; 6b; 6c) near the surface, said apparatus comprising at least one electromagnetic radiation source (2; 2a; 2b; 2c) for irradiating at least one surface region (4; 4a; 4b; 4c) of the test specimen, and a detection device (8; 8a; 8b; 8c) for detecting thermal radiation (9; 9a; 9b) emitted by the surface region and/or for detecting radiation (31) reflected from the surface region (4; 4a; 4b; 4c) of the test specimen. An evaluation device (13; 13a; 13b; 13c) for ascertaining the material property to be determined on the basis of the emitted thermal radiation (9; 9a; 9b) and/or the reflected radiation (31) is expediently provided. Advantageously, it is possible for the material property to be determined particularly reliably and nondestructively.
An apparatus for photothermal determination of a material property of a test specimen in a test specimen region near a surface of the test specimen, the apparatus comprising:
A method for photothermal determination of a material property of a test specimen in a test specimen region near a surface of the test specimen, the method comprising:
Dependencies are inferred from the claim text.