X-ray imaging system and x-ray image analysis method

An X-ray imaging system comprising:

• an X-ray emitter configured to emit X-rays to an inspection target including a target part;
• an X-ray detector configured to detect the X-rays emitted from the X-ray emitter;
• an angle changer configured to change an emission angle of the X-rays to be emitted to the inspection target;
• an image generator configured to generate first and second images as X-ray images corresponding to different emission angles different from each other based on X-rays that are detected by the X-ray detector in irradiation of the inspection target with the X rays by the X-ray emitter under change of the emission angle by the angle changer;
• and
• an image analyzer configured to calculate a three-dimensional position of the target part by using triangulation based on positions of the target part included in the inspection target in the first and second images, which are generated by the image generator, and an angle difference between the different emission angles of the X-rays that are emitted to generate the first and second images,
• wherein the image analyzer is configured to detect areas of the target part in the first and second images by using a learned model generated by machine learning, and to acquire the positions of the target part in the first and second images based on the detected areas of the target part, and
• wherein
• the target part includes first and second target parts different from each other;
• the first and second target parts have an overlap part where the first and second target parts overlap each other as viewed in an emission direction extending from the X-ray emitter toward the X-ray detector in at least one of the first and second images;
• and
• the image analyzer is configured to detect areas of the first and second target parts with one being separated from another by using the learned model generated by machine learning, and to calculate three-dimensional positions of the first and second target parts in the first and second images by acquiring positions of the first and second target parts based on the detected areas of the first and second target parts.

An X-ray imaging system comprising:

• an X-ray emitter configured to emit X-rays to an inspection target including first and second target parts different from each other;
• an X-ray detector configured to detect the X-rays emitted from the X-ray emitter;
• an image generator configured to generate an X-ray image based on X-rays that are detected by the X-ray detector in irradiation of the inspection target with the X rays by the X-ray emitter;
• and
• an image analyzer configured to detect areas of the first and second target parts in the X-ray image with one being separated from another based on an overlapping part and a non-overlapping part discriminated as separated parts by using a learned model learning to discriminate between the overlapping part that is included as both the first and second target parts in the X-ray image, which is generated by the image generator, as viewed in an emission direction extending from the X-ray emitter toward the X-ray detector and the non-overlapping part that is included in only one of the first and second target parts.